| 1. | A measurement method of microwave surface resistance of large area high tc super - conductive thin films
高温超导薄膜微波表面电阻测试方法 |
| 2. | Two kinds of microwave surface resistance rs measurements of high tc superconductive thin films are introduced in this paper , two - resonator method and the sapphire resonator method
本文介绍了两种测试高温超导薄膜微波表面电阻的方法:双谐振器法和蓝宝石介质谐振器法。 |
| 3. | Though the structures of them are different , the basic theory is the same . by measuring the value of the resonator ’ s quality factor and other relevant parameters , the microwave surface resistance rs of testing sample can be determined
这两种方法虽然采用的介质谐振器的结构不同,但基本原理是相同的,通过对谐振器q值及相关参数的测定,得到表面电阻rs的值。 |
| 4. | The dielectric constant of srtio3 ( sto ) thin films is voltage - dependent near the curie temperature tc ( about 40k ) . and no dispersion in is observed in sto at frequencies up to 10 ghz . yba2cu3o7 - x ( ybco ) high temperature superconducting thin film has very low microwave surface resistance
Srtio3 ( sto )薄膜在其居里温度附近（ ~ 40k ）具有介电常数随电场强度变化而变化的性质，同时sto在10ghz以下介电常数没有频率色散性。 |
| 5. | As the manufacture technology of high temperature superconductor ( hts ) film is improved continually , it is applied more and more widely . then it is becoming urgent to measure the microwave surface resistance of hts film that is one of the most important parameters of hts film
高温超导薄膜制备技术的不断提高使得薄膜的应用日益广泛,因而对薄膜各种性能指标的测定也显得更加重要,这就迫切需要对超导薄膜最主要特性之一微波表面电阻进行精确的测试。 |
| 6. | Sapphire resonator working in te011 + mode is used in this paper to nondestructively measure the microwave surface resistance rs of a single piece of hts thin film at 77k . the microwave surface of htsc film under test can be determined by measuring the change of the unloaded quality factors of the loaded resonator
本文就对超导薄膜的微波表面电阻的测试进行了系统的研究。本文介绍了一种利用te011 +模式的蓝宝石介质谐振器测量高温超导薄膜微波表面电阻的方法，通过测量加载超导薄膜前后介质谐振腔的固有品质因数的变化来确定超导薄膜的微波表面电阻。 |
| 7. | Srtio _ 3 ( sto ) thin films exhibit a large electric field dependence of dielectric permittivity . the microwave surface resistance of yba2cu3o7 - x ( ybco ) is much lower than that of the normal conductor . the typical value of rs for ybco epitaxial thin film is smaller than 1 m
在低温下, srtio _ 3 (简写为sto )薄膜具有强烈的非线性介电性质,即:介电常数随外加直流电场变化而变化; yba2cu3o7 - x (简写为ybco )具有极低的微波表面电阻, rs ( 10ghz , 77k ) < 1m ,而且它们的晶体结构相似,晶格常数匹配以及化学性质相容。 |
